Review Article

Hangwen Guo^*, Mohammad Saghayezhian, Zhen Wang, Yimei Zhu, Jiandi Zhang, and Ward Plummer^*, Visualizing quantum phenomena at complex oxide interfaces: An atomic view from scanning transmission electron microscopy, Front. Phys. 15(1), 13401 (2020)

(17 pages)

复杂氧化物界面一直是凝聚态物理和材料科学的中心焦点之一。在过去十余年里，球差校正的扫描透射电子显微镜已经被证明对理解界面处的量子现象是非常有价值的。本文综述了近年来利用扫描透射电子显微镜探测界面效应的一些进展和挑战。从变温技术、磁性表征、电子能量损失谱分析、电子对称性和缺陷探测等角度，讨论了理解界面现象所面临的几个重要挑战。

 Visualizing quantum phenomena at complex oxide interfaces: An atomic view from scanning transmission electron microscopy 

Hangwen Guo^1,†, Mohammad Saghayezhian², Zhen Wang^2,3, Yimei Zhu³, Jiandi Zhang², Ward Plummer^2,‡ 

1 Institute for Nanoelectronic Devices and Quantum Computing, Fudan University, Shanghai 200433, China

2 Department of Physics & Astronomy, Louisiana State University, Baton Rouge, LA 70803, USA
3 Condensed Matter Physics & Materials Science Department, Brookhaven National Laboratory, Upton, NY 11973, USA
Corresponding authors. E-mail: ^†hangwenguo@fudan.edu.cn, ^‡wplummer@phys.lsu.edu

Contents

1  Introduction

2  Advances in understanding complex oxide interfaces

   2.1  A brief introduction of scanning transmission electron microscopy (STEM)

   2.2  STEM characterization on complex oxide interfaces

       2.2.1  Structural distortions

       2.2.2  Chemical compositions

       2.2.3  Valence states

3  Challenges in understanding complex oxide interfaces

   3.1  Temperature dependent STEM

   3.2  Resolving magnetic information

   3.3  EELS, Hybridization changes and charge transfer

   3.4  Electronic and structural symmetry at the interface

   3.5  Defects at complex oxide interfaces

4  Summary